OnMicro Workshop 2026

17 September 2026 | VSL, Delft, The Netherlands

Emerging semiconductor technologies for applications such as 6G communications, automotive radar and advanced sensing require increasingly accurate measurement capabilities. Within the European OnMicro (23IND10 – On-wafer microwave metrology for future industrial applications) project, research institutes, national metrology institutes and industrial partners are working together to develop the next generation of on-wafer measurement and calibration techniques for high-frequency semiconductor devices.

This workshop brings together leading experts from across Europe to present the latest developments and results from the OnMicro project. Topics include advanced calibration techniques, AI-driven automation, innovative on-wafer measurement methods and emerging quantum sensing concepts. Participants will also experience a live demonstration of autonomous on-wafer probing and join guided laboratory tours at VSL.

Who should attend?

• Semiconductor engineers and researchers
• RF and microwave measurement specialists
• Test and measurement professionals
• Metrology experts
• R&D professionals working on 6G, sensing technologies and advanced electronics

Programme

Tijd Subject and Speaker

10:00 Welkom, Faisal Mubarak (VSL)

10:15 Introductie van het 23IND10 OnMicro-project, Gia Ngoc Phung (PTB)

10:25 Good Practice Guide: Broadband Single-Sweep vs. Conventional Banded System On-Wafer S-Parameter Measurements up to 220 GHz, Liam Ausden (NPL)

10:45 AI-Driven Nano-Robotic RF Probe Station for Automated On-Wafer Characterization, Clement Lenoir & Kamel Haddadi (ULille/CNRS)

11:30 Autonomous on-wafer probing with live stream, Faisal Mubarak (VSL)

12:10 Lunch

13:10 A Practical Guide to 16-Term Calibration of Active Two-Port Networks Using Scikit-RF, Abhijeet Kanitkar (FBH)

14:00 New quantum concept: Rydberg atoms for high-frequency electrometry, Tilman Zibold (METAS)

14:45 Panelsession and discussion, Gia Ngoc Phung (PTB)

15:00 Labtours, VSL

Why attend?

• Learn about the latest results from the European OnMicro project
• Discover advanced on-wafer characterisation techniques
• Explore AI-driven automation for RF measurements
• Gain insight into emerging quantum concepts for high-frequency metrology
• Visit VSL’s laboratories and network with experts from research and industry

Register today and discover the future of on-wafer microwave metrology!