VSL RF Excellence Workshop

The VSL RF Excellence Workshop brings together engineers, quality managers and R&D professionals to explore the practical impact of RF measurements and metrology.

Discover how reducing measurement uncertainty leads to improved performance in your production and testing processes. Gain insight into how reliable measurements contribute to higher efficiency, lower costs and better product quality.

What’s in it for you?

• Insight into reducing uncertainty in RF measurements
• Practical approaches to improve measurement reliability
• A clear link between metrology and efficiency gains
• Actionable insights to apply in your own organisation

With better control of your measurements, you can reduce risks, confidently pass audits and demonstrably improve your processes.

Participation is free of charge, but registration is required.

Program

08:30   Welcome with coffee and tea

09:30   Opening
Fabienne van Booma, VSL

10:00   Autonomous on-wafer device characterization: a key enabler for next-generation chips
Faisal Mubarak, VSL

10:40   Beyond Calibration: Building Confidence in Advanced On-Wafer RF Measurements
Rana ElKashlan, IMEC

11:20    Coffee break

11:50    First Calibration and Measurement Results of a Novel Wafer-Level Single-Sweep 100 kHz-250 GHz System
Giovanni D’amore, Keysight Technologies

12:30    Lunch

13:25    Multi Harmonic Active Load Pull for High Power High Efficiency Transistor Characterisation.
Dr. Gijs van der Bent, TNO Radar Technology

14:05    Drift reduction for RF measurements in over-temperature tests
Dr. James Hibbert, FormFactor GmbH

14:45    Coffee break

15:00    Presentation, name speaker will follow

15:40    Closing

16:00    Labtour + networking drinks

17:00    End