Theme Day Gas Analysis – Measuring at the Limits

Join our Theme Day Gas Analysis focused on measuring at the limits. As applications move towards ever lower detection limits and higher purity requirements, reliable and traceable measurements are essential.

Experts from industry, research and metrology will share the latest developments in trace and ultra-trace gas analysis, from ultra high purity gases and semiconductor applications to environmental monitoring.

Program

9:15 Welcome with coffee and tea

9:45 Opening, Fabienne van Booma, VSL

10:00 Pure Gases and Critical Impurities, Werner Wetering, Air Liquide

10:30 Remote sensing of atmospheric trace gases from Low Earth Orbit using solar backscatter spectroscopy, Ralph Snel, TNO

11:00 Trace (ppt/ppb) O2 and H2O in Ultra High Purity gases for the semiconductor industry, Jan Hordijk, Servomex

11:30 Trace analysis in air quality sensor networks, Adriaan van der Veen, VSL

12:00 Lunch

13:00 Seeing the Unseen: Advancements in Optical and Mass Spectrometry for Trace Gas Analysis, Simona M. Cristescu, Radboud University

13:30 Accuracy in the air: analytical and sampling methods for trace VOC ozone precursors, Annarita Baldan, VSL

14:00 Guided tour of the VSL laboratories

14:30 Closing reception