VSL brings European experts together on Digital‑Metrological Twins

 

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VSL brings European experts together on Digital‑Metrological Twins

February 5th, VSL was the meeting point for European experts in dimensional metrology and advanced manufacturing. As part of the EU‑funded ADAM (EPM) project, VSL hosted the M18 project meeting on the application of Digital‑Metrological Twins for new measurement technologies, followed by an open 3D CMM workshop in which these project themes were put directly into practice.

During the project meeting, the central topic was how Digital‑Metrological Twins (digital twins of measurement setups that are metrologically validated) can contribute to reliable and traceable measurements in advanced manufacturing environments. Project partners presented their progress, discussed technical challenges and aligned the next steps in their collaboration. In doing so, the ADAM project is taking an important step towards new, traceable measurement methods for complex components and freeform geometries.

On Thursday afternoon, these topics were explored in more depth during a dedicated 3D CMM workshop on freeforms and Digital‑Metrology Twins (D‑MTs). This open event attracted participants from industry, research institutes and universities. They attended in‑depth presentations, took part in interactive discussions and exchanged views on the practical use of new measurement concepts.

Speakers included Prof. Wenjuan Sun (KU Leuven), Frans‑Peter d’Hooghe (Product Manager, Mitutoyo) and ADAM partners Jan Soukal, Nabil Anwer, Gertjan Kok and Devrim Nalbantoglu. Their contributions illustrated how digital twins and advanced dimensional standards can support future industrial measurement techniques such as X‑ray computed tomography (XCT) and optical 3D scanners.

Both the meeting and the workshop underlined the importance of research into dimensional (freeform) standards and the need to pass on GD&T (Geometric Dimensioning and Tolerancing) to the next generation of engineers. Through these activities, VSL supports industry in the reliable application of new measurement technologies in advanced manufacturing processes.

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Walter Knulst
Principal Scientist Length & Optics