The optics and semiconductor industries use innovative materials and complex nanostructures in their products whose optical properties are difficult to measure and often not accurately known. This project is developping advanced mathematical methods to traceably characterise these materials for wavelength ranges from soft X-ray to IR.
The proposed research will provide a metrology solution to enable comparisons of high-performance clocks between all European NMIs, research institutes and service providers operating frequency standards.
The AMPERE project will develop reliable and scalable hybrid 4D manufacturing methods for smart systems with embedded robust electronics.
Digital transformation is everywhere in society. Metrology is also affected by the digital transformation in many ways. In his paper ‘The digital transformation and novel calibration approaches’ Gertjan Kok, Data Science & Modeling Scientist at VSL Dutch Metrology Institute, discusses how new digital technologies affect the work and the role of National Metrology Institutes such as VSL.
The scientific journal Nature has published the results of the SuperGPS project, a collaboration between VSL, VU Amsterdam and TU Delft.
