VSL Introduces Autonomous On-Wafer Measurements with New Automated Probing System
VSL now operates a fully autonomous on-wafer measurement system, a major milestone for chip calibrations.
VSL now operates a fully autonomous on-wafer measurement system, a major milestone for chip calibrations.
Machine vision systems are crucial to many high-value industries, where Europe is globally competitive, and to the EU objectives for digital transformation and the Green Deal.
Supporting advanced production processes using so-called Digital Metrology Twins (D-MTs), where VSL will mainly work on a digital representation of tactile measurements on the CMM.
Scatterometry facilities and activities at VSL nanometrology laboratory
Virtual experiments and digital twins are key enabling technologies to achieve and realise European strategic policies devoted to sustainability and digitalisation within the complex framework of Industry 4.0 and the European Green Deal.
This Research mobility grant together with EMPIR project 20FUN02 POLight aims to enhance multiple optical measurement methods for use in nano-metrology.