D. Zhao and G. Rietveld, “The influence of Source Impedance in Electrical Characterization of Solid State Lighting Sources”, Submitted for publication in the Proceedings of the 2012 Conference on Precision Electromagnetic Measurements, Washington, US (2012).
This paper investigates the impact of source impedance in electrical characterization of solid state lighting products. A typical current spectrum is given and a model is used to show the significant influence brought about by variable source impedance. In practice, such changes in source impedance are inevitable for measurements done in different locations. A method is proposed to eliminate this impact by inserting a source impedance stabilization network between equipment under test and power supply. It is proved that this method guarantees less than 0.02 % variation in the measurement results which is acceptable for performance evaluation of SSL products.
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