{"id":28536,"date":"2026-01-08T12:20:45","date_gmt":"2026-01-08T10:20:45","guid":{"rendered":"https:\/\/www.vsl.nl\/?page_id=28536"},"modified":"2026-01-13T11:18:55","modified_gmt":"2026-01-13T09:18:55","slug":"semiconductors","status":"publish","type":"page","link":"https:\/\/www.vsl.nl\/en\/themes\/semiconductors\/","title":{"rendered":"Semiconductors"},"content":{"rendered":"

[vc_section full_width=”stretch_row” content_placement=”middle” css=”.vc_custom_1767867154615{background-image: url(https:\/\/www.vsl.nl\/wp-content\/uploads\/2026\/01\/Halfgeleiders.jpg?id=28537) !important;background-position: center !important;background-repeat: no-repeat !important;background-size: cover !important;}” el_class=”main_header gradient_header dg-position-realtive”][vc_row equal_height=”yes” content_placement=”middle” el_class=”dg-header–small”][vc_column width=”1\/2″ el_class=”dg-padding-none full_width_responsive”][vc_column_text css=”.vc_custom_1767866511544{margin-bottom: 0px !important;padding-bottom: 0px !important;}” el_class=”text-white”]<\/p>\n

Semiconductors<\/b><\/h1>\n

Metrology for Next\u2011Gen Chips, Power Electronics and Photonics<\/b><\/h2>\n

VSL supports chip manufacturers, equipment builders and suppliers with independent, ultra\u2011precise measurements and standards at the nano and microscale. This gives you objective references for processes, tooling and new technologies. <\/span>[\/vc_column_text][\/vc_column][vc_column width=”1\/2″][\/vc_column][\/vc_row][\/vc_section][vc_section el_class=”dg-padding-mid-top brand_element_small”][vc_row][vc_column width=”2\/3″ el_class=”full_width_responsive dg-padding-none”][vc_column_text css=”” el_class=”dg-padding-small”]<\/p>\n

Introduction<\/p>\n

Metrology Is Indispensable for the Semiconductor Industry<\/b><\/h2>\n

 <\/p>\n

In the production of advanced chips, PICs and power electronics, every nanometre and every picosecond counts. New node generations, 3D architectures and wide\u2011bandgap materials such as SiC and GaN are increasing complexity. At the same time, pressure on price and time\u2011to\u2011market is high. <\/span><\/p>\n

Without an independent reference, you do not always have clear answers to questions such as: what is the true critical dimension of this structure? How reliable is my measurement at extreme aspect ratios? Or how does a new device perform under cryogenic conditions? Without traceable references, it is difficult to benchmark technologies, substantiate specifications and convincingly demonstrate that you comply with standards and agreements. <\/span>[\/vc_column_text][\/vc_column][vc_column width=”1\/3″ css=”.vc_custom_1757065353790{margin-top: 0px !important;margin-right: 0px !important;margin-bottom: 0px !important;margin-left: 0px !important;padding-top: 0px !important;padding-right: 0px !important;padding-left: 0px !important;}” el_class=”full_width_responsive tablet_expert”]

\n\t
\n\t\t\n\t\t
\n\t\t\t
\"\"<\/div>\n\t\t<\/figure>\n\t<\/div>\n
\n\t
\n\t\t
\n\t\t\t

Would you like to know more about our services?<\/h3>\n

Our experts are happy to help.<\/p>\n\n\t\t<\/div>\n\t<\/div>\n\n\t

\n\t\t
\n\t\t\t

Michael van Schaik<\/b>
\nSr. Accountmanager<\/p>\n\n\t\t<\/div>\n\t<\/div>\n\n\t

\n\t\t
\n\t\t\t<\/i> vsl@vsl.nl<\/a>\n\t\t<\/div>\n\t<\/div>\n<\/div><\/div><\/div><\/div><\/div><\/div><\/div><\/div><\/section><\/div>[\/vc_column][\/vc_row][vc_row full_width=”stretch_row” equal_height=”yes” content_placement=”middle” el_class=”dg-padding-small” css=”.vc_custom_1767701827139{background-color: #FAFAFA !important;}”][vc_column width=”5\/6″ el_class=”full_width_responsive dg-padding-none”][vc_column_text css=”” el_class=”dg-padding-small”]<\/p>\n

The Role of Metrology in the Semicon Value Chain<\/b><\/h2>\n

 <\/p>\n

Metrology provides the independent basis that allows you to:<\/span><\/p>\n

    \n
  • Calibrate and verify dimensions, shapes and roughness down to the nanoscale level<\/span><\/li>\n
  • Characterise electrical and RF properties of devices on\u2011wafer and in packaging.<\/span><\/li>\n
  • Benchmark new sensor technology, photonic building blocks and quantum devices.<\/span><\/li>\n
  • Determine the efficiency and reliability of power electronics objectively.<\/span><\/li>\n<\/ul>\n

     <\/p>\n

    Through traceable standards and hybrid measurement strategies (for example AFM combined with optical techniques and on\u2011wafer measurements), you create a robust reference framework for your own inline metrology.<\/span>[\/vc_column_text][\/vc_column][vc_column width=”1\/6″][\/vc_column][\/vc_row][vc_row el_class=”dg-padding-small” css=”.vc_custom_1767701747503{background-color: #FFFFFF !important;}”][vc_column width=”5\/6″ el_class=”full_width_responsive dg-padding-none”][vc_column_text css=”” el_class=”dg-padding-small”]<\/p>\n

    How VSL Supports the Semiconductor Industry<\/b><\/h2>\n

     <\/p>\n

    VSL has a specialised role within the Dutch and European semiconductor sector, with services that support both R&D and production, including:<\/span><\/p>\n

      \n
    • Development and application of advanced nanometrology techniques (AFM, scatterometry, ptychography) for characterisation of nanostructures.<\/span><\/li>\n
    • Calibration of optical systems, including NA calibrations of microscope objectives, for traceable microscopy.<\/span><\/li>\n
    • On\u2011wafer DC and RF characterisation of components, including measurements at cryogenic temperatures in collaboration with quantum partners.<\/span><\/li>\n
    • Support around metrology for photonics and integrated photonics \u2013 for example in characterisation of optical losses, light fields and bonded connections.<\/span><\/li>\n
    • Measurements and methods for evaluating power electronics, focusing on efficiency, thermal behaviour and reliability.<\/span><\/li>\n<\/ul>\n

       <\/p>\n

      VSL also works closely with universities, research institutes and industry in national and European projects, so you benefit from the latest metrological insights without having to build a full primary measurement laboratory yourself.<\/span>[\/vc_column_text][\/vc_column][vc_column width=”1\/6″ css=”.vc_custom_1642591123225{margin-top: 0px !important;margin-right: 0px !important;margin-bottom: 0px !important;margin-left: 0px !important;padding-top: 0px !important;padding-right: 0px !important;padding-left: 0px !important;}”][\/vc_column][\/vc_row][vc_row full_width=”stretch_row” css=”.vc_custom_1767701879793{background-color: #FAFAFA !important;}” el_class=”dg-padding-small”][vc_column width=”5\/6″ el_class=”full_width_responsive dg-padding-none”][vc_column_text css=””]<\/p>\n

      Accelerate Semicon Innovation with Independent Metrology<\/b><\/h2>\n

       <\/p>\n

      Are you working on new nodes, PICs, quantum devices or WBG power electronics and looking for independent validation or calibration? Or do you want to align your metrology roadmap with international standards? VSL helps you substantiate your choices and reduce risks in R&D and scale\u2011up. <\/span>[\/vc_column_text][\/vc_column][vc_column width=”1\/6″ css=”.vc_custom_1642591123225{margin-top: 0px !important;margin-right: 0px !important;margin-bottom: 0px !important;margin-left: 0px !important;padding-top: 0px !important;padding-right: 0px !important;padding-left: 0px !important;}”][\/vc_column][\/vc_row][vc_row css=”.vc_custom_1767701481331{background-color: #FFFFFF !important;}”][vc_column width=”5\/6″ el_class=”full_width_responsive dg-padding-none”][vc_column_text css=”” el_class=”dg-padding-small”]Read the latest metrology developments as regards:[\/vc_column_text][vc_basic_grid post_type=”page” max_items=”3″ style=”pagination” items_per_page=”9″ arrows_design=”vc_arrow-icon-arrow_01_left” arrows_position=”outside” paging_design=”none” loop=”yes” item=”315″ css=”” grid_id=”vc_gid:1768295913630-1ec22747-5c57-5″ el_class=”services-slider services_slider_home” taxonomies=”120″][\/vc_column][vc_column width=”1\/6″ css=”.vc_custom_1642591123225{margin-top: 0px !important;margin-right: 0px !important;margin-bottom: 0px !important;margin-left: 0px !important;padding-top: 0px !important;padding-right: 0px !important;padding-left: 0px !important;}”][\/vc_column][\/vc_row][\/vc_section][vc_section el_class=”dg-padding-mid”][vc_row css=”.vc_custom_1641224545247{margin-bottom: 0px !important;padding-bottom: 0px !important;}”][vc_column el_class=”dg-padding-none”][vc_column_text]Also interesting:[\/vc_column_text][vc_basic_grid post_type=”post” max_items=”3″ style=”pagination” items_per_page=”9″ arrows_design=”vc_arrow-icon-arrow_01_left” arrows_position=”outside” paging_design=”none” loop=”yes” item=”315″ css=”” grid_id=”vc_gid:1768295913630-2af70708-cb6b-7″ el_class=”services-slider services_slider_home” taxonomies=”120″][\/vc_column][\/vc_row][\/vc_section]<\/p>\n<\/div>","protected":false},"excerpt":{"rendered":"

      The energy transition is in full swing. The Netherlands is working on a national transition from fossil fuel power to energy generated from renewable sources. For this, we depend on reliable and traceable measurements.<\/p>\n","protected":false},"author":4,"featured_media":28537,"parent":3072,"menu_order":0,"comment_status":"closed","ping_status":"closed","template":"","meta":{"_acf_changed":false,"inline_featured_image":false,"footnotes":"","_links_to":"","_links_to_target":""},"categories":[],"tags":[],"class_list":["post-28536","page","type-page","status-publish","has-post-thumbnail","hentry","description-off"],"acf":[],"yoast_head":"\nVSL | Metrology and Semiconductors<\/title>\n<meta name=\"description\" content=\"VSL supports chip manufacturers, equipment builders and suppliers with independent, precise measurements and standards at the nano and microscale.\" \/>\n<meta name=\"robots\" content=\"index, follow, max-snippet:-1, max-image-preview:large, max-video-preview:-1\" \/>\n<link rel=\"canonical\" href=\"https:\/\/www.vsl.nl\/en\/themes\/semiconductors\/\" \/>\n<meta property=\"og:locale\" content=\"en_US\" \/>\n<meta property=\"og:type\" content=\"article\" \/>\n<meta property=\"og:title\" content=\"VSL | Metrology and Semiconductors\" \/>\n<meta property=\"og:description\" content=\"VSL supports chip manufacturers, equipment builders and suppliers with independent, precise measurements and standards at the nano and microscale.\" \/>\n<meta property=\"og:url\" content=\"https:\/\/www.vsl.nl\/en\/themes\/semiconductors\/\" \/>\n<meta property=\"og:site_name\" content=\"VSL\" \/>\n<meta property=\"article:modified_time\" content=\"2026-01-13T09:18:55+00:00\" \/>\n<meta property=\"og:image\" content=\"https:\/\/www.vsl.nl\/wp-content\/uploads\/2026\/01\/Halfgeleiders.jpg\" \/>\n\t<meta property=\"og:image:width\" content=\"12500\" \/>\n\t<meta property=\"og:image:height\" content=\"6250\" \/>\n\t<meta property=\"og:image:type\" content=\"image\/jpeg\" \/>\n<meta name=\"twitter:card\" content=\"summary_large_image\" \/>\n<meta name=\"twitter:label1\" content=\"Est. reading time\" \/>\n\t<meta name=\"twitter:data1\" content=\"4 minutes\" \/>\n<script type=\"application\/ld+json\" class=\"yoast-schema-graph\">{\"@context\":\"https:\/\/schema.org\",\"@graph\":[{\"@type\":\"WebPage\",\"@id\":\"https:\/\/www.vsl.nl\/en\/themes\/semiconductors\/\",\"url\":\"https:\/\/www.vsl.nl\/en\/themes\/semiconductors\/\",\"name\":\"VSL | Metrology and Semiconductors\",\"isPartOf\":{\"@id\":\"https:\/\/www.vsl.nl\/#website\"},\"primaryImageOfPage\":{\"@id\":\"https:\/\/www.vsl.nl\/en\/themes\/semiconductors\/#primaryimage\"},\"image\":{\"@id\":\"https:\/\/www.vsl.nl\/en\/themes\/semiconductors\/#primaryimage\"},\"thumbnailUrl\":\"https:\/\/www.vsl.nl\/wp-content\/uploads\/2026\/01\/Halfgeleiders.jpg\",\"datePublished\":\"2026-01-08T10:20:45+00:00\",\"dateModified\":\"2026-01-13T09:18:55+00:00\",\"description\":\"VSL supports chip manufacturers, equipment builders and suppliers with independent, precise measurements and standards at the nano and microscale.\",\"breadcrumb\":{\"@id\":\"https:\/\/www.vsl.nl\/en\/themes\/semiconductors\/#breadcrumb\"},\"inLanguage\":\"en-US\",\"potentialAction\":[{\"@type\":\"ReadAction\",\"target\":[\"https:\/\/www.vsl.nl\/en\/themes\/semiconductors\/\"]}]},{\"@type\":\"ImageObject\",\"inLanguage\":\"en-US\",\"@id\":\"https:\/\/www.vsl.nl\/en\/themes\/semiconductors\/#primaryimage\",\"url\":\"https:\/\/www.vsl.nl\/wp-content\/uploads\/2026\/01\/Halfgeleiders.jpg\",\"contentUrl\":\"https:\/\/www.vsl.nl\/wp-content\/uploads\/2026\/01\/Halfgeleiders.jpg\",\"width\":12500,\"height\":6250},{\"@type\":\"BreadcrumbList\",\"@id\":\"https:\/\/www.vsl.nl\/en\/themes\/semiconductors\/#breadcrumb\",\"itemListElement\":[{\"@type\":\"ListItem\",\"position\":1,\"name\":\"Home\",\"item\":\"https:\/\/www.vsl.nl\/en\/\"},{\"@type\":\"ListItem\",\"position\":2,\"name\":\"Themes\",\"item\":\"https:\/\/www.vsl.nl\/en\/themes\/\"},{\"@type\":\"ListItem\",\"position\":3,\"name\":\"Semiconductors\"}]},{\"@type\":\"WebSite\",\"@id\":\"https:\/\/www.vsl.nl\/#website\",\"url\":\"https:\/\/www.vsl.nl\/\",\"name\":\"VSL\",\"description\":\"Nationaal Metrologisch Instituut\",\"potentialAction\":[{\"@type\":\"SearchAction\",\"target\":{\"@type\":\"EntryPoint\",\"urlTemplate\":\"https:\/\/www.vsl.nl\/?s={search_term_string}\"},\"query-input\":{\"@type\":\"PropertyValueSpecification\",\"valueRequired\":true,\"valueName\":\"search_term_string\"}}],\"inLanguage\":\"en-US\"}]}<\/script>\n<!-- \/ Yoast SEO plugin. -->","yoast_head_json":{"title":"VSL | Metrology and Semiconductors","description":"VSL supports chip manufacturers, equipment builders and suppliers with independent, precise measurements and standards at the nano and microscale.","robots":{"index":"index","follow":"follow","max-snippet":"max-snippet:-1","max-image-preview":"max-image-preview:large","max-video-preview":"max-video-preview:-1"},"canonical":"https:\/\/www.vsl.nl\/en\/themes\/semiconductors\/","og_locale":"en_US","og_type":"article","og_title":"VSL | Metrology and Semiconductors","og_description":"VSL supports chip manufacturers, equipment builders and suppliers with independent, precise measurements and standards at the nano and microscale.","og_url":"https:\/\/www.vsl.nl\/en\/themes\/semiconductors\/","og_site_name":"VSL","article_modified_time":"2026-01-13T09:18:55+00:00","og_image":[{"width":12500,"height":6250,"url":"https:\/\/www.vsl.nl\/wp-content\/uploads\/2026\/01\/Halfgeleiders.jpg","type":"image\/jpeg"}],"twitter_card":"summary_large_image","twitter_misc":{"Est. reading time":"4 minutes"},"schema":{"@context":"https:\/\/schema.org","@graph":[{"@type":"WebPage","@id":"https:\/\/www.vsl.nl\/en\/themes\/semiconductors\/","url":"https:\/\/www.vsl.nl\/en\/themes\/semiconductors\/","name":"VSL | Metrology and Semiconductors","isPartOf":{"@id":"https:\/\/www.vsl.nl\/#website"},"primaryImageOfPage":{"@id":"https:\/\/www.vsl.nl\/en\/themes\/semiconductors\/#primaryimage"},"image":{"@id":"https:\/\/www.vsl.nl\/en\/themes\/semiconductors\/#primaryimage"},"thumbnailUrl":"https:\/\/www.vsl.nl\/wp-content\/uploads\/2026\/01\/Halfgeleiders.jpg","datePublished":"2026-01-08T10:20:45+00:00","dateModified":"2026-01-13T09:18:55+00:00","description":"VSL supports chip manufacturers, equipment builders and suppliers with independent, precise measurements and standards at the nano and microscale.","breadcrumb":{"@id":"https:\/\/www.vsl.nl\/en\/themes\/semiconductors\/#breadcrumb"},"inLanguage":"en-US","potentialAction":[{"@type":"ReadAction","target":["https:\/\/www.vsl.nl\/en\/themes\/semiconductors\/"]}]},{"@type":"ImageObject","inLanguage":"en-US","@id":"https:\/\/www.vsl.nl\/en\/themes\/semiconductors\/#primaryimage","url":"https:\/\/www.vsl.nl\/wp-content\/uploads\/2026\/01\/Halfgeleiders.jpg","contentUrl":"https:\/\/www.vsl.nl\/wp-content\/uploads\/2026\/01\/Halfgeleiders.jpg","width":12500,"height":6250},{"@type":"BreadcrumbList","@id":"https:\/\/www.vsl.nl\/en\/themes\/semiconductors\/#breadcrumb","itemListElement":[{"@type":"ListItem","position":1,"name":"Home","item":"https:\/\/www.vsl.nl\/en\/"},{"@type":"ListItem","position":2,"name":"Themes","item":"https:\/\/www.vsl.nl\/en\/themes\/"},{"@type":"ListItem","position":3,"name":"Semiconductors"}]},{"@type":"WebSite","@id":"https:\/\/www.vsl.nl\/#website","url":"https:\/\/www.vsl.nl\/","name":"VSL","description":"Nationaal Metrologisch Instituut","potentialAction":[{"@type":"SearchAction","target":{"@type":"EntryPoint","urlTemplate":"https:\/\/www.vsl.nl\/?s={search_term_string}"},"query-input":{"@type":"PropertyValueSpecification","valueRequired":true,"valueName":"search_term_string"}}],"inLanguage":"en-US"}]}},"_links":{"self":[{"href":"https:\/\/www.vsl.nl\/en\/wp-json\/wp\/v2\/pages\/28536","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/www.vsl.nl\/en\/wp-json\/wp\/v2\/pages"}],"about":[{"href":"https:\/\/www.vsl.nl\/en\/wp-json\/wp\/v2\/types\/page"}],"author":[{"embeddable":true,"href":"https:\/\/www.vsl.nl\/en\/wp-json\/wp\/v2\/users\/4"}],"replies":[{"embeddable":true,"href":"https:\/\/www.vsl.nl\/en\/wp-json\/wp\/v2\/comments?post=28536"}],"version-history":[{"count":0,"href":"https:\/\/www.vsl.nl\/en\/wp-json\/wp\/v2\/pages\/28536\/revisions"}],"up":[{"embeddable":true,"href":"https:\/\/www.vsl.nl\/en\/wp-json\/wp\/v2\/pages\/3072"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/www.vsl.nl\/en\/wp-json\/wp\/v2\/media\/28537"}],"wp:attachment":[{"href":"https:\/\/www.vsl.nl\/en\/wp-json\/wp\/v2\/media?parent=28536"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/www.vsl.nl\/en\/wp-json\/wp\/v2\/categories?post=28536"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/www.vsl.nl\/en\/wp-json\/wp\/v2\/tags?post=28536"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}