Dongsheng Zhao, Gert Rietveld, J.-P. Braun, F. Overney, T. Lippert and A. Christensen, “Traceable measurement of the electrical parameters of solid‐state lighting products”, Proceedings of the 2014 Conference on Precision Electromagnetic Measurements, Rio de Janeiro, Brazil, 650 – 651 (2014).
In order to perform traceable measurements of the electrical parameters of solid-state lightning (SSL) products, it is essential to technically adequately define the measurement procedure and to identify the relevant uncertainty sources. This paper fills the related gaps in the present written standard for testing SSL products. New uncertainty sources with respect to conventional lighting sources are determined and their effects quantified. For power measurements on SSL products the main uncertainty sources are temperature dependence, power supply THD, and stabilization of the SSL product. For current rms measurements the influence of bandwidth, shunt resistor, power supply source impedance, and ac flatness error are significant as well.
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