Virtual training course: Metrology for measurement of nanoparticle size by electron microscopy & atomic force microscopy

09/22/2020

VSL Dutch Metrology Institute invites you to participate in a virtual half-day free training course to be held in the afternoon of 27 October 2020.

The training course will focus on the challenges associated with the preparation, measurement and data analysis of nano particle reference materials within the framework of the European Metrology Programme for Innovation and Research (EMPIR) project nPSize. The metrology of SEM, TEM and AFM methods for particle imaging will be presented as well as a hybrid metrology approach, standardization and machine learning for advanced analysis of measurement data. 

The training course will include lectures from key stakeholders and project partners including BAM, LNE, PTB, SMD, Pollen, NIMS and VSL and is targeted at PhD students, reference materials providers, analysis and accredited laboratories and instrument manufacturers.

We hope you can join this training course and would be grateful if you can confirm your attendance before 23 October 2020 by registering using the form in the link below so we can invite you to participate. Also, if you have any further questions please feel free to email Marion de Niet (mdniet@vsl.nl). 

Yours sincerely, on behalf of the nPSize consortium partners,

Richard Koops (rkoops@vsl.nl)
Scientist
Dimensional Metrology


Registration closed


 

Agenda

Time (CET)

Activity

13:00 - 13:05

Opening – R. Koops (VSL)

13:05 - 13:20

The EMPIR project nPSize – D. Hodoroaba (BAM)

13:20 - 13:45

Metrology of SEM measurements of nanoparticles – L. Crouzier (LNE)

13:45 - 14:10

Metrology of TSEM measurements of nanoparticles – T. Klein (PTB)

14:10 - 14:35

Metrology of AFM measurements of nanoparticles – R. Koops (VSL)

14:35 - 14:50

Sample preparation – C. Hörenz (BAM)

14:50 - 15:15

Break

15:15 - 15:35

Hybrid methods for microscopy of nanoparticles (SEM/TSEM/AFM) – N. Feltin, D. Hodoroaba et al. (LNE/BAM/SMD)

15:35 - 16:00

Machine learning in Nanoparticle Metrology – Julien Baderot (POLLEN)

16:00 - 16:20

VAMAS RRT for Shape and Size Analysis of Nano-particles by Atomic Force Microscopy – Dr. Daisuke Fujita (NIMS)

16:20 - 16:40

OECD projects on nanoparticle characterisation – A. Schmidt (BAM)

16:40 - 17:00

In-situ nano particle metrology using traceable flow cytometry – A. van de Nes (VSL)

17:00 - 17:05

Closing statements – R. Koops (VSL)